Please cite our article : Chunling Wu, Xiaojun Huang, Jing Cheng, Dongjie Zhu, Xinzheng Zhang. High-quality, high-throughput cryo-electron microscopy data collection via beam tilt and astigmatism-free beam-image shift. https://doi.org/10.1016/j.jsb.2019.09.013
Uploaded by Xiaojun Huang and Chunling Wu, maintainance by Xiaojun Huang and Dongjie Zhu. Aquiring cryo-EM data by beam image shift method. Detailed information of the scripts is in "readme.docx".