C++ code to perform calculation of the optical properties of thin films.
The goal is to create a C++ library that is capable of calculating reflection, transmission, absorption and ellipsometric parameters (tg(Psi) and cos(Delta)) of any given multilayer thin film stack, including stacks that consist of periodically repeating layers.
The code can be used by people who design various types of optical coatings, like anti-reflection coatings, mirrors, beamsplitters, etc. In addition it may be usefull to those, who analyze/simulate ellipsometric data.
The projects contains two files:
- multilayer.h
- multilayer.cpp
- clone the repository to yor own project
- include multilayer.h in you project
More information on the code and examples of its usage can be found in the Manual.pdf in the docs folder.
In addition, the code (without the support of periodically repeating layers) is implemented in the Opal software, that can be found under https://github.com/mbiednov/opal/releases
The results are compared with FDTD. Due to the increased time in simulating reflectity by FDTD, the example only compares the range of incidence angle from 0 to 40 deg. The wavelength is 632nm.
